Brands Okos
Okos - ODIS WinSAM
ODIS WinSAM è l'ultimo software per microscopia acustica con un ricco contenuto tecnico basato sulle attuali piattaforme e feedback del settore…
Okos - Trasducers
I trasduttori ultrasonici OKOS sono appositamente progettati per la rilevazione di difetti, misurazione dello spessore, ispezione della linea di legam…
Okos - AL12250
The AL12250 is a single channel, non simultaneous dual input A/D board for the PCI bus. It is optimized for high-speed transient capture at sampling r…
Okos - AL81004C
AL81004C is a four channel A/D board for the PCI bus and both PCI 32-bit and PCI 64-bit bus compliant. It is optimized for high-speed transient captur…
Okos - AL8250
The AL8250 is a single channel, non simultaneous dual input A/D board for the PCI bus. It is optimized for high-speed transient capture at sampling ra…
Okos - AL8xGTE-3 Digitizer
AL8xGTE-3 is a single-channel, high resolution, 8 bit 3 GS/s PCIExpress Digitizer board upporting the PCI Express x1 bus. Onboard memory options range…
Okos - AL8xGTE-1.5 Digitizer
AL8xGTE-1.5 AL8xGTE-1.5 is a single-channel, high resolution, 8 bit 1.5 GS/s PCIExpress Digitizer board upporting the PCI Express x1 bus. Onboard memo…
Okos - AL8xGTE-1 Digitizer
AL8xGTE-1 is a single-channel, high speed, 8 bit 1 GS/s PCI Express Digitizer board upporting the PCI Express x1 bus. Onboard memory options range fro…
Okos - NDT-CF 300
Multi Axes NDT Scanner Compact Footprint Controllo NDT ad ultrasuoni di:Materiali duriCompositiLeghe personalizzateGiunti di saldaturaPlasticaCircuiti…
Okos - UT NDT System per Tubature
UT NDT System for Pipe, Tube & Billet Inspection
Okos - Multi Axis XYZ-TT-GS
Industrial Immersion Scanning Utilizzando le tecnologie più recenti, l'ispezione a immersione consente il rilevamento interno e dei difetti.Le …
Okos - Solar Panel Inspection Scanner
Custom engineered for inspecting Solar Panels, MACROVUE accommodates all size panels, and allows detection of: Bond integrity between glass and PV mat…
Okos - MACROVUE-P
Scanning Acustic Microscope Semiconductor Package Failure Analysis:VoidsDisbondsCracksDelaminationInternal defects Customer Interface:Dual 22” H…
Okos - VUE 250P
Scanning Acustic Microscope Semiconductor Package Failure Analysis:VoidsDisbondsCracksDelaminationInternal defects Customer Interface:Dual 22” H…
Okos - VUE 400P
Scanning Acustic Microscope Semiconductor Package Failure Analysis:VoidsDisbondsCracksDelaminationInternal defects Customer Interface:Dual 22” H…

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