Semiconductor Parametric Test Software
ITECH SPS5000 semiconductor parametric test software is equipped with the IT2800 high precision source measurement unit.
It helps to quickly complete semiconductor test of device IV characterization and parametric test.SPS5000 supports DC, pulse, single and bidirectional sweeping modes.
With an intuitive GUI, the SPS5000 helps university laboratories, semiconductor suppliers and research institutes to quickly perform semiconductor device characterization test.
No programming knowledge is required when you use it.
SPS5000 software provides ready-to-use test items for different types of semiconductor devices such as MOSFETs, BJTS, diodes, and resistors.
Product Features
- Intuitive GUI simplifies measurement setup, I-V characterization and data analysis
- Provides ready-to-use test items for MOSFETs/BJTs/Diodes/Resistors for quick Recall
- Automated test sequence function for continuous execution of multiple parameter tests for devices*1
- Interactive and real-time data plotting accelerates review of test results
- Quick test mode to perform up to 32ch DUTs test simultaneously
- Built-in database allows user to store and rapidly recall the data and graphs
- Powerful graph analysis tools such as auto-scaling and line operations
- Multiple Y axes capabilities and configurable parameter type and scale type of Y-axis/X-axis
- Provides customized test item function*2
- Software compatible with Windows 7 (or above) operating system
- Test fixture IT-E803 for low-power diodes and Mosfet test (42V/1A)
- Capable used with IT2800 series SMU, Minimum resolution up to 100nV/10fA
